EDN

Advantest’s newest memory tester doubles DRAM, flash throughput

SANTA CLARA, Calif. — Advantest Corp. today announced it has begun selling new DRAM and flash memory tester that has the ability to simultaneously test up to 128 devices at a time with speeds of 143 ...
EDN

Credence rolls out desktop tester for low-voltage flash memories

FREMONT, Calif. — In a move to lower the cost of test, Credence Systems Corp. here today announced a new desktop tester for low-voltage, flash-memory devices. The Personal Kalos XZ from Credence is a ...
Business Wire

Advantest Announces NAND Flash Test Solutions

TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
Electronic Design

Solutions provide total NAND flash memory test

T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides ...
The Business Journals

Teradyne paying $325M for memory test firm

Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has agreed to spend $325 million to purchase San Jose-based Nextest Systems Corp. The acquisition would provide ...
Electronic Design

Advantest launches newest memory burn-in tester to meet growing demand for NAND Flash and DRAM devices

TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...