Some fabs build consumer chips that sit inside phones and laptops. Others build chips that must survive in orbit, under the Arctic ice, or deep beneath the Earth’s surface. Fabs serving defense, ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
MINNEAPOLIS — August Technology Corp. has rolled out its latest NSX Series of automated macro defect inspection tools for advanced metrology applications. The NSX-115 is optimized for 2D gold and ...
“Wafer mass metrology has become increasingly important as semiconductor processes have become more complex and sensitive,” said Microtronic CEO Reiner Fenske in making the announcement. “Today’s fabs ...
April 15, 2013. Rudolph Technologies Inc., a provider of process characterization equipment and software for the semiconductor and related industries, announced that it has sold an NSX Series macro ...
HAWTHORNE, N.Y., July 17, 2020 /PRNewswire/ -- SEMICON West 2020 – Microtronic, maker of high-speed full-wafer macro defect inspection systems and software, has just announced an innovative new way to ...
FLANDERS, N.J.--(BUSINESS WIRE)--Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for wafer fabs and advanced packaging facilities, ...
The macro defect detection sector of the metrology market will grow nearly 25 percent on top of a near 180 percent increase last year, according to market forecasters at The Information Network. This ...
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