A physics-based autofocus method uses dual LED lighting to detect and correct defocus in microscopes. It enhances imaging ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

When using a measurement microscope, users can measure the size and dimensions of sample features in both two and three dimensions, which is important for inspection, quality control (QC), failure ...

Stereo microscopes are often the first choice when high-quality 3D perception of samples is required in the lab or an industrial facility. Users will frequently spend hours looking through the ...