EDN

Accel-RF system tests reliability of GaN devices

Joining a family of RF reliability test systems is the HiPR-AARTS (High Power RF Automated Accelerated Reliability Test System) from Accel-RF, intended to help manufacturers prove the reliability of ...
Semiconductor Engineering

Using Deep Data Analytics To Enhance Reliability Testing The Fast Roadmap for Zero Defects

proteanTecs and ELES have partnered together to enhance reliability testing with deep data analytics. This collaboration enables SoC manufacturers to improve their qualification envelope to achieve ...
Electronic Design

Test System Supplier Helps Implement Accelerated Testing

The Direct Customer Advantage Program from QualMark Corp., Denver, Colo., offers on-line access to timely information to support accelerated reliability testing programs. Through the program, ...
EDN

RF device reliability testing takes center stage

http://www.maxwell.comSystem reliability concerns are imperative to the implementation of today's broadband wireless infrastructure. Wireless networks require new ...
Electronic Design

Accelerated Testing Creates Better Products Sooner

Every product design that contains a microprocessor, circuit card, or electromechanical assembly can benefit from highly accelerated life testing (HALT) to increase the speed of development, eliminate ...
Semiconductor Engineering

Reliability Comparison of 28 V – 50 V GaN-on-SiC S-Band and X-Band Technologies

Dig into the details of just how reliable are some GaN/AlGaN high electron mobility transistor (HEMT) MMIC released process technologies are for S-Band and X-Band. August 14th, 2019 - By: Wolfspeed, a ...
Machine Design

Optical Sensors: Apply Reliability Strategies to Drive Smart Component Selection

What are the key factors in optimizing mean time between failure (MTBF)? Developing the best strategy for MTBF. What to look for in MTBF test studies. For designers of engineered electronics powering ...