The California-based startup Span has developed small, fractional data centers, or “nodes,” called XFRA units.

Board-level and semiconductor test data are often analyzed separately, limiting correlation across the product lifecycle. Linking PCB assembly (PCBA) test results, including in-circuit and functional ...

Are you grappling with managing your test data in an automation framework? Here’s a fact: effective Test Data Management (TDM) can significantly improve your software testing process. This ...

Test automation and DevOps play a major role in today's quality assurance landscape. As we know, software development is evolving at a rapid pace. This requires finding robust ways to invest in ...

The combination of machine learning plus more sensors embedded into IC manufacturing equipment is creating new possibilities for more targeted testing and faster throughput for fabs and OSATs. The ...

Demand for more and better data for test is driving a major standards effort, paving the way for one of most significant changes in data formats in years. There is good reason for this shift. Data ...

The most important test of a data architecture is not how it performs on day one. It is how it behaves when the business ...